Refractive Index of Cadmium Sulfide Films Determined from Transmittance Measurements

  • Zaheer Hussain Shah Department of Physics, School of Science, University of Management and Technology, Pakistan
  • Imtiaz Ahmad Department of Physics, School of Science, University of Management and Technology, Pakistan
  • Rabia Nasar Department of Physics, School of Science, University of Management and Technology, Pakistan
DOI: https://doi.org/10.32350/sir.34.02
Keywords: CdS, optical properties, thin films, transmittance

Abstract

Abstract Views: 91

In the present work the refractive indices of thermally evaporated films of cadmium sulfide (CdS) on fused silica substrates were obtained from measurement of transmittance (T, alone) at normal incidence. Earlier, the same were determined by using measurements of reflectance (R) and transmittance (T) again at normal incidence. On comparison of the two results, we noted that the present results are in fact more, closer than those obtained earlier to the corresponding values reported for the bulk cadmium sulfide.

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Published
2019-12-31
How to Cite
1.
Zaheer Hussain Shah, Imtiaz Ahmad, Rabia Nasar. Refractive Index of Cadmium Sulfide Films Determined from Transmittance Measurements. Sci Inquiry Rev. [Internet]. 2019Dec.31 [cited 2024Dec.22];3(4):21-9. Available from: https://journals.umt.edu.pk/index.php/SIR/article/view/658
Issue
Vol 3 No 4: December 2019
Section
Orignal Article

Copyright (c) 2019 Zaheer Hussain Shah, Imtiaz Ahmad, Rabia Nasar

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This work is licensed under a Creative Commons Attribution 4.0 International License.